Test Dispatch - Nov 2025 Newsletter
1. Hardware Abstraction: A proper HAL (Hardware Abstraction Layer) means replacing an instrument requires no code change in the main TestStand sequence.
Fact
Myth
Why it Matters: The entire purpose of the HAL is to act as a buffer. The main TestStand sequence only calls a generic function (e.g., MeasureVoltage). The HAL translates that request into the specific instrument driver code. This decoupling allows you to swap a Keysight DMM for an NI DMM without altering the higher-level test logic.
2. Parallel Testing: Running test sequences in parallel guarantees a linear reduction in total test time.
Fact
Myth
Why it Matters: Reduction is rarely linear because of shared resources. If multiple units in parallel are trying to use the same power supply, network port, or high-CPU function, one step will inevitably wait for another. Identifying and addressing these bottlenecks is key to efficient parallelization.
3. Data Traceability: Logging only the final Pass/Fail status is sufficient for full product traceability.
Fact
Myth
Why it Matters: Full traceability requires logging the detailed measurement data (the actual voltage, current, etc.) and all relevant metadata (like serial number, operator ID, and limits). If a product fails later in the field, you must be able to trace its exact performance profile back to the manufacturing floor using this data for effective root cause analysis.
Solving the Cycle Time Crisis A prevalent bottleneck in production is Excessive Cycle Time. We often discover that significant time savings can be accomplished through straightforward, fundamental adjustments. This might include conducting verification in parallel or examining data at the binary level rather than necessitating a complete image analysis. TestStand Mastery
Consider enhancing your functional testing with a strong test executive. Engaging in TestStand Training can help engineers develop modular, scalable, and maintainable test sequences, which are key for efficient Production Validation and End-of-Line Test Systems. Synchronized Measurements: The Key to Trustworthy Data. If you're curious about how even minor timing discrepancies (skew) among various sensors can affect intricate R&D or manufacturing data, in this blog we delve into how Synchronized Measurements within your DAQ system, using a shared clock and triggers, can effectively eliminate this skew. This approach ensures precise, time-correlated data, which is crucial for dependable analysis and informed decision-making.